差分探頭| P6251

更新時(shí)間：2024-09-07

產(chǎn)品型號(hào)：P6251

產(chǎn)品報(bào)價(jià)：

產(chǎn)品特點(diǎn)：差分探頭| P6251 ?Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
?Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
?Remote GPIB/USB

P6251差分探頭| P6251的詳細(xì)資料：

差分探頭| P6251

Features & Benefits

Outstanding Electrical Performance

1 GHz and 500 MHz Probe Bandwidth
<1 pF Differential Input Capacitance
1 MΩ Differential Input Resistance
±42 V （DC + pk AC） Differential Input Voltage
>18 dB CMRR （at 250 MHz 50X attenuation）
Selectable Bandwidth-limiting Filters
DC Reject

Versatile DUT Connectivity

Small Compact Probe Head for Probing Small Geometry Circuit Elements
Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
Robust Design for Reliability

Easy to Use

Provides Automatic Units Scaling and Readout on the Oscilloscope Display
TDP1000, TDP0500
- Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
- Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
- Remote GPIB/USB Probe Control through the Oscilloscope
- AutoZero – Zeros Out Output Offset
P6251
- Connect Directly to the TekProbe™ Interface Oscilloscopes, or to TekConnect^® Oscilloscopes using TCA-BNC Adapter

Applications

High-speed Switch Mode Power Supply Design
CAN/LIN Bus Design
High-speed Digital Design
Digital Design and Characterization
Manufacturing Engineering Test
Research and Development

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply （SMPS）, CAN/LIN Bus, and high-speed digital system designs.

Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, and P6251 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges: